Testing

Working with the design specifications, fixtures, set-ups and test process are established to exercise critical design features, with an emphasis on speed and cost reduction.

Wafer level, automated probing station.
Scanning Electron Microscopy (SEM)
Energy Dispersive X-Ray Spectroscopy (EDS)
Focused Ion Beam (FIB)
ZYGO® Surface Profilers and Interferometers
ZYGO® Surface Profilers and Interferometers
Various custom-built test stations.