Testing AND CHARACTERIZATION

Working with the design specifications, fixtures, set-ups and test process are established to exercise critical design features, with an emphasis on speed and cost reduction.

Wafer level, automated and manual porbe station.
Scanning Electron Microscopy (SEM) with energy dispersive X-ray spectroscopy (EDS).
Focused Ion Beam (FIB)
ZYGO® Surface Profilers and Interferometers
We can also perform Reliability plus Mil-Spec Testing